Everything you could've wanted to know about 1T-SRAM-Q
Why memory density & the unique aspects of MoSys Quad-core ram are integral in the Revolution's design objectives become readily apparent once we delve into its capabilities & fabrication. This is actually the fourth generation produced by MoSyS & is by far the most impressive. Technical advancements of the previous 3 iterations are all incorporated within the Revolution's 1T-SRAM-Q. (1T-SRAM, 1T-SRAM-M, & 1T-SRAM-R) Nintendo is aiming roughly for around these outside case dimensions. 1.9"(H) x 6.5"(W) x 8.5"(D)=105 inches cubed As an aside memory was occupying over 50% SOC (system on chip) silicon area at the end of 2002, 71% in '05, & an estimated 90% in 2014 if not sooner. (obviously not necessarily in reference to console platforms, but the RAM technology sector in general) 2002 was also the 1st time memory content surpassed even logic content on chip.
One of the reasons why 1T-SRAM-Quad-core is so important to such a small casing design like the Rev's. is that its density allows for a substantially smaller memory bit cell while retaining the same bit capicatance as 1T-SRAM, while reducing its size x2 as I stated previously. (further reducing the necessary on die space) MoSys introduced its first-generation 1T-SRAM that delivered twice the density of 6T-SRAM while using standard CMOS logic processes (complementary metal-oxide-semiconductor) that the GC incorporated. 1T-SRAM-Q, like 1T-SRAM retains the refresh free, single-cycle operations for greater data throughput like its referenced namesake. (6T-SRAM) Acheived by MoSys's patented Multi-Bank architecture. Which essentially partitions its memory into small banks, during each banks normal idle cycles internal refresh management circuitry ensures that each cell’s capacitor retains its charge by performing refresh operations that occur transparently in the background, independent of the system interface simultaneously without ever affecting either the read or write cycles. Even banks that are accessed for prolonged periods can nevertheless refresh thanks to a unique caching scheme that ensures periodic idle cycles even for those active banks.
What 1T-SRAM-Q took from the second generation M is its dramatically lower standby power characteristics. 1T-SRAM-M features unique leakage suppression circuitry that achieves standby current as low as 10μA/Mbit with full data retention. Initially intended for mobile applications, & optional for those designers who want to include these power conserving & leakage controlling functions in Q-core, which I'm sure Genyo Takeda (Nintendo's lead console development engineer) & his core of engineers in all probability did. You can begin to see why this ram solution would have looked more & more attractive to Nintendo's low-power consumption philosophy, in addition to the Rev's smaller form function. With the 3rd generation R, MoSys refined & enhanced the quality & reliability of embedded ram as designers began adding more blocks comprising larger memory arrays to SoCs. Embedded ram, & specifically its quality had emerged as an issue of concern.
In addition R improved yields during manufacturing, improved reliability after manufacturing and enhanced soft error rate (SER) during product use. With 1T-SRAM-R, MoSys augmented the basic 1T-SRAM architecture with an enhanced reliability option called Transparent Error Correction (TEC™) – a MoSys patented technology that eliminates the need for costly repair during manufacture or slow self-repair at power-up. Unlike conventional redundancy-based repair approaches, TEC dynamically repairs errors during manufacturing, avoiding the additional manufacturing costs and delays associated with laser repair during production. Furthermore, TEC dynamically repairs errors during use, providing SER under 10 FITs/Mbit – 1,000x less than that of 6T SRAM. While conventional ECC approaches add 20 to 30% more area for additional redundant memory bits, TEC adds essentially no additional area. Although it uses 20% more bit cells, its bit cells are 20% smaller than even 1T-SRAM's cells. They enhanced the comprehensive quality of embedded ram without the requisite silicon overhead, since MoSys utilizes metal instead of silicon.
Now finally onto the 4th generation, 1T-SRAM-Q. It posseses all of the aforementioned features plus an innovative trademarked capacitor, dubbed the Folded Area Capacitor (FAC) technology. 1T-SRAM-Q memory provides a very high-density embedded memory solution, requiring only an additional non-critical mask and two simple steps that exert no adverse affects on logic. With this technology, SoC designers can begin to achieve true system-level memory solutions, incorporating arrays of over 128 Mb at 0.13 μm and over 256 Mb at 90nm. (if only, but there would be no possible way Nintendo could include 256mb or more of Quad-core while still offering the system at its projected price point of $200-250) At these memory sizes, designers can integrate main memory on SoCs, reducing external chip count while speeding overall application performance.
In memory technology, smaller means faster timing and lower power operation, because operating characteristics can scale down with the smaller bit cell. A smaller cell means shorter metal bit lines, which translates to reduced parasitics. In turn, reduced parasitics enable faster timing and higher performance. Besides shorter metal bit lines, 1T-SRAM-Q memory’s shorter metal word lines mean faster charging and discharging – and faster read and write cycles. In fact, while 1T-SRAM's technology has provided 40%-50% speed improvements at each succeeding technology node, these factors enable 1T-SRAM-Q memory to offer a 10 to 20 percent speed improvement over 1T-SRAM memory at the same process node. (which of course we know will not be the case here, 90nm Quad-core for the Revolution)
In fact, 1T-SRAM-Q technology offers another fundamental advantage in signal integrity, which can also lead to further memory enhancements. The 1T-SRAM-Q capacitor provides about the same charge storage as the 1T-SRAM capacitor. Because its bit cell is 2x smaller than the 1T-SRAM cell, however, 1T-SRAM-Q technology provides an improved ratio of stored charge to parasitics, resulting in an improved signal-to-noise ratio (SNR). Typically, high-density designs face tighter signal margins as voltages drop in more advanced process technologies at 90nm and below. With its improved SNR, however, 1T-SRAM-Q can take advantage of additional available timing margin to speed performance or increase reliability for applications that do not require clock rates at the edge of the envelope.
The favorable ratio of charge to bit cell circuitry also translates directly into reduced power-dissipation characteristics for 1T-SRAM-Q memory solutions. Shorter wires, fewer parasitics and lower voltage combine to reduce 1T-SRAM-Q memory’s dynamic power requirements without ever negatively impacting its speed or reliability.
Using an additional mask, (one of the two steps I mentioned prior) the 1T-SRAM-Q's fabrication process uses two extra steps to etch a well in the shallow trench isolation (STI) layer and fill it with polysilicon. Oxide forms naturally, bending from the horizontal plate down into the well creating the 1T-SRAM-Q’s Folded Area Capacitor. The FAC well reaches deep into the STI layer, providing a robust capacitor structure that retains a large effective area – and charge – even as the bit cell is scaled down to more advanced technology nodes at 65nm and 45nm.
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The additional etch and implant steps occur before the transistors are even fabricated, so this approach introduces no extra thermal cycles. In contrast, embedded DRAM requires process changes that cause additional thermal cycles. These additional heating and cooling passages affect the characteristics of the logic transistors. As a result, embedded DRAM processes are inevitably different from standard logic processes, and logic transistors produced with embedded DRAM processes do not have quite the same performance as those produced with standard logic processes. Because 1T-SRAM-Q memory’s process does not introduce additional thermal cycles, engineers can be confident that this process does not impact the performance of the rest of the chip. Furthermore, the 1T-SRAM-Q's process does not result in any adverse topography, because there are no FAC structures rising higher than the plane to affect layers placed above it.
So as you can see, (or I have hopefully demonstrated) why 1T-SRAM-Q was the perfect memory solution for the Revolution even over XDR & GDDR3 as well. A comparative analysis of all 3's features including speed will be forthcoming in my next post.