That would be against the trend of the last years: die sizes have been going up despite the increase of transistors per mm2.
So has the talk of going multi-die.
Wafer diameters haven't grown beyond 300mm, so there are manufacturing parameters that have not scaled at all in recent years.
Is there a problem with current process variations? If not, why do you expect this to happen now?
AMD's had known issues with its 65nm A64s.
http://investorshub.advfn.com/boards/read_msg.asp?message_id=21353453
I know it's a post in the intel section, but the numbers are indicative of process issues at 65nm.
The clock differential between the lowest rung of the released 65nm parts to the highest is only 600 MHz, though it is likely the lower qualifying parts would have been culled.
The power consumption, if voltages and clocks were equalized, would be much , much higher.
AMD's Barcelona is said to have circuit tuning that helps mitigate some of this variation, but it obviously is not out yet in quantity, and it has clocking issues.
Repeated steppings and process tuning are likely to push Barcelona up to and over 3 GHz.
The amount of work this will likely require is part of the increasing troubles with combating variation.
There is no expectation for this to be any easier at 45nm and below.
No, they have to be even better. (And they are...)
Most of the published yield curves by various CPU manufacturers show the defect rates on well-tuned processes tend to level off pretty close to one another.
The overall rate of physical defects in the wafers is something that seems to put a floor on the defect rates.
I haven't noticed major breakdowns in the correlation of timing models vs. reality, but you seem to have access to different data points. Please share.
I don't have the numbers directly, but there were a number of interesting discussions on aceshardware on this.
Fabs don't normally release the distribution data, but there was a rough idea that the worst-case variation was something close to linear for clock timing, and much worse when it came to leakage between devices on the order of 10x (all else being equal).
Sadly, that forum has been shuttered.
This was debated by those who would have very good data, but I admit I may very well have misremembered the final amounts.
Device variation was characterized as having a linear factor between devices, something like a factor of two between the extremes, while leakage varied much more.
That's just a matter of choosing the right process. These things are very predictable.
Most predictions by IEE and ISSCC papers (and Gordon Moore) are that variation is going to suck past 65nm.
There are loads of papers on techniques to make designs more tolerant of variation, which I hope are implemented for GPUs sooner rather than later.
Intel's success at getting quad core CPUs out over a year before AMD's single-die solution shows that there are benefits to multichip at 65nm.
Intel does not intend to go single-chip until the next process node, when the die size falls in line with current dual cores.
With the expectation that design, wafer, and fab costs for future nodes are going to rise, I'm betting conservatively that this constraint would be the same or similar for GPUs.