Panajev2001a
Veteran
jvd,
yeah, that could be a path people might want to follow... there is a problem though and this is PCB costs....
Following your example, the T&L chip would need quite a fat and fast bus that connects it with the rest of the GPU+memory controller and that is going to increase PCB manufacturing costs requiring more and more traces and layers and stricter tolerance.
But if this is cheaper than rushing to an even smaller manufacturing process I think it is viable... in this case the scalable and modular approach Sony, IBM and Toshiba are following with Cell prooves to be a winning solution...
Cell based designs will likely have more redundancy ( you can have a CPU which uses 8-16 PEs and the T&L unit which uses only 4 PEs... this is an hypotetical design, not PlayStation 3 ) as you base your approach on basic and uniform bulding blocks which you basically repeat over and over and that can svae you costs as you do not need several heavily diversified manufacturing lines... you might use the same one...
overclocked,
Sony and Toshiba already announced the completion ( whcih doesn't mean they have the fabs upgraded to 65 nm technology yet ) of their 65 nm ( SOI based IIRC ) manufacturing process a while ago...
And the PR...
yeah, that could be a path people might want to follow... there is a problem though and this is PCB costs....
Following your example, the T&L chip would need quite a fat and fast bus that connects it with the rest of the GPU+memory controller and that is going to increase PCB manufacturing costs requiring more and more traces and layers and stricter tolerance.
But if this is cheaper than rushing to an even smaller manufacturing process I think it is viable... in this case the scalable and modular approach Sony, IBM and Toshiba are following with Cell prooves to be a winning solution...
Cell based designs will likely have more redundancy ( you can have a CPU which uses 8-16 PEs and the T&L unit which uses only 4 PEs... this is an hypotetical design, not PlayStation 3 ) as you base your approach on basic and uniform bulding blocks which you basically repeat over and over and that can svae you costs as you do not need several heavily diversified manufacturing lines... you might use the same one...
overclocked,
Sony and Toshiba already announced the completion ( whcih doesn't mean they have the fabs upgraded to 65 nm technology yet ) of their 65 nm ( SOI based IIRC ) manufacturing process a while ago...
Toshiba, Sony unveil 65-nm embedded memory process
By Mark LaPedus
Semiconductor Business News
December 5, 2002 (1:00 p.m. EST)
TOKYO--Enabling the shift towards “ubiquitous computing,†Japan's Toshiba Corp. and Sony Corp. late Monday announced the world's first 65-nm CMOS process technology for embedded memories.
The process technology will enable single-chip devices, said to be one-fourth the size of current embedded chips in the market. The process also enables a 30-nm transistor with the world's fastest switching speeds, as well as the world's smallest cell for embedded DRAM and SRAM.
Toshiba and Sony have utilized 65-nm process to fabricate an embedded DRAM with a cell size of 0.11um2, which will enable a 256-megabit memory to be integrated on a single chip. It also fabricated the world's smallest embedded SRAM cell of only 0.6um2.
The technology will bring the market towards what the companies call “ubiquitous computing,†that is, total connectivity at all times, according to Toshiba and Sony.
The new process technology is the result of a joint development of 90- and 65-nm CMOS processes, which was initiated in May 2001 (see May 18, 2001 story ). Full details will be presented at the International Electron Devices Meeting (IEDM) in San Francisco from Dec. 9-11.
In a release issued late Monday, the companies described some of the details of the process, including the development of a high-performance transistor with a 30-nm gate length.
Fabricated with 193-nm lithography tools and phase-shift photomasks, the transistor is said to have switching speeds of 0.72-ps for NMOSFET and 1.41-ps for PMOSFET at 0.85-Volt (Ioff=100nA/um).
The transistor makes use of a nitrogen concentration plasma nitrided, oxide-gate dielectrics to suppress gate leakage current. This optimization reduces leakage current approximately 50 times more efficiently than conventional silicon dioxide film and allows formation of an oxide with an effective thickness of only 1-nm.
To reduce wiring propagation delay and power dissipation, a low-k dielectric material is adopted. The target effective dielectric constant of the interlayer dielectric is around 2.7.
And the PR...
Toshiba and Sony Make Major Advances in Semiconductor Process Technologies
3 December, 2002
65-nanometer process technology will create small, powerful System LSIs
Toshiba Corporation
Sony Corporation
TOKYO, December 3, 2002 -- Toshiba Corporation and Sony Corporation today announced the world's first 65-nanometer (nm) CMOS process technology for embedded DRAM system LSIs -- a major breakthrough in process technology for highly advanced, compact, single-chip system LSIs that will be only one-fourth the size of current devices while offering higher levels of performance and functionality.
The move to ubiquitous computing -- total connectivity at all times -- relies on high-performance equipment. These in turn require advanced SoC (system on chip) LSIs integrating ultra-high performance transistors and embedded high-density DRAM. In such devices, size and performance levels are directly related to process technology: finer lithography results in smaller devices that offer higher levels of performance. The new process technology announced by Toshiba and Sony and integration to a new level that allows bandwidths to be scaled up and the maximization of system performance.
Current system LSI devices on the market are produced with 130 nanometer process technologies. Toshiba, the recognized industry leader in advanced process technology, is the only company with mass production technology for 90nm process embedded DRAM system LSI, a technology it is currently deploying and that will meet ever increasing demand for more and more compact devices.
The new SoC technologies for 65nm process generation include: 1) a high-performance transistor with the world's fastest switching speed; 2) the world's smallest cell for embedded DRAM; and 3) the world's smallest cell for embedded SRAM.
The new process technology is the result of joint development of Toshiba Corporation and Sony Corporation of 90nm and 65nm CMOS process technology that was initiated in May 2001. Full details will be presented at the December 9 - 11 International Electron Devices Meeting (IEDM) in San Francisco.
Outline of new technology
1) High-performance transistor with 30nm gate length:
Transistors in this technology have high nitrogen concentration plasma nitrided oxide-gate dielectrics to suppress gate leakage current. This optimization reduces leakage current approximately 50 times more efficiently than conventional SiO2 film and allows formation of an oxide with an effective thickness of only 1nm. Furthermore, Ni silicide is applied in the gate electrodes and source/drain regions to attain low resistance and to reduce junction leakage current. Shallow extension formation optimizing ultra-low energy ion implantation, spike RTA and offset spacer process successfully suppresses the short channel effect of MOSFET and achieves superior roll-off characteristics. An excellent switching speed of 0.72psec for NMOSFET and 1.41psec for PMOSFET at 0.85V (Ioff=100nA/um), were obtained. Currently available Hi-NA193-nm lithography with alternating phase shift mask and slimming process provides 30nm gate lengths.
2) Embedded DRAM cell:
High-speed data processing requires a single-chip solution integrating a microprocessor and embedded large volume memory. Toshiba is the only semiconductor vendor able to offer commercial trench-capacitor DRAM technology for 90nm-generation DRAM-embedded System LSI. Toshiba and Sony have utilized 65nm process to technology to fabricate an embedded DRAM with a cell size of 0.11um2, the world's smallest, which will allow DRAM with a capacity of more than 256Mbit to be integrated on a single chip.
3) Embedded SRAM cell:
SRAM is sometimes used as cache memory in SoC systems. The Hi-NA193-nm lithography with alternating phase shift mask and the slimming process combined with the non-slimming trim mask process will achieve the world's smallest embedded SRAM cell in the 65nm generation an areas of only 0.6um2.
4) 180nm Multi layer wiring:
In order to reduce the chip size, it is important reduce the pitch of the first metal of the lowest layer. The new technology has a 180nm pitch, a 75% shrink from the 90nm generation. To reduce wiring propagation delay and power dissipation, a low-k dielectric material is adopted. The target effective dielectric constant of the interlayer dielectric is around 2.7.
Note: 1 nanometer = one billionth of a meter
Press Inquiries:
Toshiba Corporation
Tel: 81-3-3457-2105
Email: press@toshiba.co.jp
Sony Corporation
Tel: 81-3-5448-2200
Email: yoshikazu.ochiai@jp.sony.com