This seems too good to be true. I'd like to know your opinions.
"They represent the first real 22 nm resist data, building confidence for EUV as a viable technology for 22 nm half-pitch lithography"
http://www.fabtech.org/index.php?option=com_content&task=view&id=65710&Itemid=69
"They represent the first real 22 nm resist data, building confidence for EUV as a viable technology for 22 nm half-pitch lithography"
http://www.fabtech.org/index.php?option=com_content&task=view&id=65710&Itemid=69